[tabs slidertype=”top tabs”] [tabcontainer] [tabtext]Transcript[/tabtext] [/tabcontainer] [tabcontent] [tab]
How to Gather Prior Use Failure Rate Data
0:06
Welcome to this Application Explainer video, part of our Operate and Maintain topic range.
0:11
In this video, we’ll cover the subject of prior use failure rate gathering in SLM.
0:17
Within SLM’s Operate and Maintain module, event data recorded for the devices associated to a PUC will automatically build up failure rates for the PUC.
0:28
These events may include anything with a pass, fail status, or affecting a device’s timing service, such as demands, tests, and bypasses.
0:37
The following information will be covered in this training.
0:40
Chapter one will be referencing the failure Rate library creation material.
0:44
Chapter 2 will be Device Generic Model Association and Chapter 3 will be Events auto tracking of device event data contributing to PUC failure rates.
0:59
Population and configuration of the prior use certificates.
1:02
Failure rate library is covered in MSSS Failure Rate Library videos.
1:08
Please check these videos out For more information on this topic.
1:14
In Chapter 2, we’ll cover selecting a prior use certificate for a device and things to consider if selected PUC options for the device differ from the selections made from the parent instrument, the system will provide a notice for the user highlighting this discrepancy.
1:31
In the Operate and Maintain module, a device may have a prior certificate value selected and attributed to the object.
1:38
With this association made, SLM will accumulate and log hours in use and event results against the associated PUC.
1:47
To select the PUC value, the Cascading device, event, device type fields, Device Function, Process Measurement which is for the input device only and device type will be selected.
1:59
That will narrow down the options available to the manufacturer and finally to the prior use certificate field options.
2:06
With the PUC selected for a device, the association will now be made in event data and hours tracked against the device and therefore the PUC.
2:17
To open the view for the associated prior certificate, simply click on the link on the Device Usage Certification Status field, which displays the current status of the associated PUC.
2:35
In Chapter 3, we’ll cover device performance data from recorded events and how these contribute to the PUC, and things to consider.
2:43
Devices must be in a state of commissioned to contribute to PUC tracking.
2:49
To ensure the devices will contribute to the PUC accumulated data, devices must be in a commissioned status.
2:56
This is set by entering a service status change event to the parent function that includes the device, whose status may be confirmed in the Performance data table or in the Device service status history log.
3:10
As events such as demands, tests, bypasses, and others are captured against the device, SLM will accumulate service hours, prior use hours, demands, failures, etc.
3:30
For the device, which will then be sent up to the associated prior use certificate to accumulate with data captured for other devices associated with the same PUC.
3:41
This is all done automatically as events are captured and finalized or approved and do not require further manual entry by the user.
[/tab] [/tabcontent] [/tabs]
