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Failure Rate Library
0:06
Welcome to this Application Explainer video part of our Failure Rate library topic range within SLMS Global or Operate and maintain modules.
0:15
Prior use certificates may be configured to hold both entered static and event based auto updated failure rates for instruments and model types used by the instruments and devices in the instrumented systems and operate and maintain modules.
0:30
The following information will be covered in this training chapter.
0:33
One will be creating prior use certificates, Chapter 2 will be PUC cascading fields, Chapter 3 will be PUC failure Rate population, Chapter 4 will be association with SLM device objects, and Chapter 5 will be device usage approvals including Prior use Qualification checklist.
0:56
In Chapter 1 we’ll cover how to create a new prior use certificate and things to consider.
1:02
PUC’s are specific to the group of instrument kind, input, output, etcetera and cannot be shared between these as the same PUC.
1:11
Importing of PUC’s to create in bulk is allowed.
1:15
Prior use certificates exist at the enterprise level and can be managed in the global and operate maintain modules.
1:21
These prior use certificates or PUC’s are effectively instrumentation model types that can be applied to function instruments and against which can be accumulated through device events hours where the model type has been proven to have been in a state of reliability.
1:40
SLM will calculate for each PUC in service failure rates as well as allow recording of manually set failure rates for each PUC.
1:49
These PUC’s are also specific to the use of instruments such as sensors, final elements, and logic solvers, and as such are split into Input PUC’s, Output Pucs, and Logic Solver Pucs.
2:03
To edit the data for an existing PUC, simply click the link on the PUC’s ID or model type or model number to open the page for that PUC or to create a new record, open the Edit Tools menu from this view and click the appropriate option.
2:24
Enter the desired model number and click Save.
2:34
As with other types of data, these Pucs may also be imported through the Adapters module to create or edit the fields of multiple Pucs at the same time.
2:48
In Chapter 2, we’ll cover identifying the PUC data, field entries and selections, and things to consider.
2:54
Available options in selection fields may be configured in the IO Type Codes reference table.
2:59
Function instruments are specific per their function and type, so accordingly, prior U certificates are also specified per function and per type as determined by the options selected in the function.
3:13
Process measurement and type fields for input Pucs or only for the function and type fields for output and logic solver PUC’s.
3:23
These fields provide cascading options that depend on the previous field selected.
3:27
For example, selecting Transmitter in the Input PUC’s function field and Pressure in the Process measurement field will provide these options for the Input type field, whereas selecting Flow for the Process measurement field will provide these other options.
3:44
The options that are available in this cascading fields are configurable for admin accounts in the reference table IO types codes in the System module, through which these options are equivalent to the field options available in the input, output, logic, Solver, and Device corresponding data fields.
4:02
It is the selected options in these fields that allow SLM to attribute the Pucs to instruments and devices within the functions.
4:11
So the event data may be accumulated back up to the Pucs for the previously mentioned prior use or in service failure rates.
4:23
In Chapter 3, we’ll cover entering design basis and external source PUC failure rates and things to consider.
4:31
These failure rates are entered manually by the user and a static, while the in service failure rates are also updated from event data tracking in SLM.
4:40
Within each PUC, information may be populated.
4:44
For the manual failure rate data, up to three externally sourced failure rates may be recorded, as well as another for the manufacturer’s failure rate of the model type.
4:54
But the most important manually entered failure rate field is the default design failure rate for Enterprise, as this field will be the value used for the design basis failure rate source in the sealk out functionality.
5:07
Any of these other 4 externally sourced failure rates or another rate entirely may be used within this field.
5:14
The other in service failure rates are calculated from event data from the Operate Maintain module and will not be initially populated for new PUC.
5:27
In Chapter 4, we’ll cover how PUC’s are associated to devices and things to consider.
5:33
Device association is subject to site usage configuration for each PUC, and SLM tracks and displays device events and failure data for each PUC.
5:44
Before a PUC may be selected for an instrument or device, the PUC must be configured to be allowable for site usage where the instrument or device resides.
5:54
For instance, if I wish to associate a PUC to a device in the Long Beach site, the site must first be selected for the PUC.
6:04
Once allowable to be used within a site, the PUC will then be an available option to select when the appropriate cascading options are selected for the Instrument type and manufacturer fields for an instrument or device within that same site.
6:22
Any devices to which the PUC is attributed are then displayed in the Model usage.
6:29
At the bottom of the details view for the specific PUC.
6:37
In Chapter 5, we’ll cover entered and tracked PUC usage data and things to consider.
6:43
SLM may still allow PUC to be used by devices even if the model type is not marked as certified for use, if the site usage configuration allows so.
6:54
Each RIU certificate may also be assigned usage approvals, such as severity of services in which the model type is acceptable for use, certification status and basis and tracking of qualifications for usage with regards to the popularity of the instrument type, compliance with standards and personnel training for proper usage.
7:15
To help with these decisions for the PUCSLM provides, within the same view, usage number of the PUC within SLM to include hours in service and overall calculated failure rates, as well as the failure rates per severity of service.
7:31
Note here though, that SLM will still allow Pucs to be used by instruments and devices according to the PUC site usage configuration, regardless of the device usage certification status.
7:43
This leaves prior use certificate usage up to the SLM user so that prior use hours may begin to be accumulated for a model type that is still earning its status.
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