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Configuring Test Groups
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Welcome to this application Explainer video, part of our operate and maintain topic range.
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In this video, we’ll cover the subject of configuring test groups in SLM.
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The safety requirement specification establishes testing frequency for each function and its IO and logic solver.
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The following are examples of methods that can be used for these tests.
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All input and outputs in a unit, function only testing, function group testing and SIS testing.
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SLM organises these test procedures in test groups to reflect the testing methods used at the site or the unit.
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The following information will be covered in this training.
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Chapter 1 will be the overview, Chapter 2 will be test group creation, Chapter 3 will be test event Workflow, and Chapter 4 will be testing Reports.
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In Chapter 1, we’ll cover requirements for creating test groups with devices, relationships for test groups, and relationships for test events.
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Requirements for creating test groups with devices is that the device is in a commissioned state.
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Test groups are created as children of the unit objects in Operate and maintain.
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This allows any functions and devices in that unit to be added to that test group.
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Any function can be added to the test group, however a device must be commissioned before it can be selected for that test group.
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To determine whether a device is commissioned, this can be seen on the Device object on the 1st tab in the Performance Data section.
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As seen here, Test events, unlike other events, are children the test group.
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These test events can be seen under the test group.
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By expanding that test group, the test group allows for both functional tests and device test results to be recorded.
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Functional tests can be found as a child of the function viewed here, which shows the results of that test, whether it passes, fails, and the dates of that test, and so on.
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Whereas device test results are found as children of the device events, which shows similar information, whether it passes, fails, the date of the test, and any other details for that device test.
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Both the function and device test results can be seen on the test event object, each having its own dedicated tab, functional test results and device test results.
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Once the test event has been recorded, the data can be reviewed for accuracy before finalising or approving the event.
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Approving and finalising an event has the same effects in SLM, which contributes to specific calculations, namely the device failure rates, prior use hours and Tier 3 metric calculations for the functions completed.
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Test events will update specific information on the test group such as the last Test date, next test due date determined by the test interval, the number of days the test is due in or overdue by, and the test status.
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Below are the tables showing lists of functions, inputs, outputs, logic solvers, auxiliary functions, as well as information from any previous tests conducted from this test group.
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In Chapter 2, we’ll cover test group workflow and modifying existing test groups.
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To create a test group, navigate to the Unit object, click on Edit Tools, and Add Test Group.
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A lightbox window will display a three-step process to build a test group.
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First enter in the basic information.
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Next, select the functions, and 3rd select your devices that are going to be tested in this test group.
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In the first step, we’ll enter in the test group ID the description for the test group.
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Test group type, whether it’s on or offline, the module that the functions exist in, whether the test group is active, and then other information like test group interval.
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Next, select the functions that will be a part of this test group.
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Lastly, select the devices that you want to have included in this test group.
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You can select between inputs, outputs, or logic solvers or auxiliary functions.
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When satisfied with the selections, click Save to create the test group.
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After saving, the view will display the information for that test group, including the test information that you added from step one, the functions, inputs, outputs, and logic solvers that were selected.
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If at any point you want to modify what is being tested in this test group, click on the Select Functions and Devices button where it takes you to Step 2 of the Test Group workflow, allowing you to add, change, or remove functions in Step 2 or devices in Step 3.
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Once finished with the changes, click Save and the test group is now modified to display the updated selections for Functions and devices.
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In Chapter 3, we’ll cover recording a test event, viewing test event results, and effects of a test event on a test group.
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Once test groups have been created, test results can be recorded in SLM.
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To start this process, navigate to the desired test group or unit, click on Edit Tools, and record Test Event.
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This will open up a lightbox window showing the test event workflow at the top of the screen.
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Remember that the lightbox can be expanded for a better user experience.
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Step one shows the initial information for the test, like the results, the date description, and any notes.
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Selecting Pass for the As Found status will skip all steps where the failure information is entered, Steps 456 and seven.
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If any other status like Pass with fail safe failures or Fail with dangerous failures is selected, steps 4 through 7 will be enabled to enter the information for that failure.
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When all information is filled out, click next to proceed to the next step with step two.
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Select the functions that will be tested in the test event.
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Keep in mind, if no functions are tested in this test event, none need to be selected.
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When all the apply are selected, click next step three.
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Select all the devices, the inputs, outputs, or logic solvers that are to be tested.
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For this test group, select Next.
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Remember that the AS Found drop down in step one dictates whether the next step is Step 4 or step 8 because something other than PASS was selected in step one.
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For the As found, steps 4 through 7 are enabled.
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Step 4 allows you to select which functions had a status other than PASS, meaning pass with fail, safe, failures, or failed.
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Once the desired functions have been selected, click next to proceed.
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For step five, click on the bar to expand the function information, which will allow you to fill out the applicable failure information for the function, such as the as found and the as left statuses and dates.
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The function response time if recorded, any failure codes, the cause of the failure, and so on.
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If the function has an as found status of fail with dangerous failures, this will contribute to the fail on test rates.
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One of the five Tier 3 metrics for the function.
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To learn more about Tier 3 metrics, see the Operate Maintain video on Tier 3 metrics.
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If no function was selected in Step 4, these fields for the function will not appear in Step 5.
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Clicking next takes us to Step 6 where we select any input, output, or logic solver devices that have failed their tests.
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Any of these components that are not selected will automatically have a past status given to them.
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Click next to proceed to step 7 to fill out the information for the devices.
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This step shows a list of all devices selected.
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In step six, click on the bar with the tag to expand the section and fill out the fields for that device, starting with the as found and as left statuses and dates.
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You can also fill out other information in the fields like the failure codes, the failure types, description, mitigating action and so on.
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This will allow you to have a more detailed record of that failure on the maintenance activity below to specify what kind of repair had occurred.
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This allows you to make note of any maintenance performed to allow for the change in the as found and as left statuses.
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Clicking next takes you to step 8, which shows the test results for each device tested and the specified or designed response time.
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Here you can enter in the observed response time in comparison to the specified response time.
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After all information is entered, click Save.
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This allows the processing of that test event.
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After confirming the data, the test event can be submitted for approval or on the Test Summary tab can be finalised.
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Approving and finalising an event has the same effect in SLM, which contributes to specific calculations, namely the device failure rates, prior use hours and Tier 3 metric calculations.
11:17
For the functions completed test events, we’ll update the specific information on the test group, such as the test status, the last Test date and next test due date, as well as the test due in and overdue buyer fields.
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In Chapter 4, we’ll cover Test group reports, test status report, and test groups overdue and on schedule.
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The first report that we’ll look at is the Test Group report.
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This can be found at the site or the unit on the Test Groups tab.
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This report shows all test groups for the site or unit, depending on which level is shown, including the status and date of the last Test, with hyperlinks to view the results.
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In addition to the test interval and due date for the next test, this view can also be sorted to show when tests are due in chronological order.
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Next, the Test Status tab, also found at the site and unit level, shows a series of tables displaying testing information for each test group, like the due date, the amount of time it’s overdue by or due in, and the last date the test was performed.
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We can see this information for first overdue tests, then tests due in the upcoming year, deferred tests, tests that are recently completed, tests that are pending approval, and also tests that have not been submitted for approval or finalization.
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The last three tables also show the as Found and as left statuses of the tests listed.
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Another useful report to look at for tests from a high level perspective is the test groups by Overdue and On Schedule.
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This can be found on the Overview tab of the Enterprise Site and Unit Levels.
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This report displays a pie graph of tests that are overdue colored in red versus the test groups that are on schedule colored in green.
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Below there is a table which displays information for each of these tests and hyperlinks to drill down into more of the details of each test group.
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